MARVEL Series Laser Cutting Machine
SMART Series Laser Cutting Machine
FARLEY·LASERLAB provides semiconductor solutions covering wafer annealing, laser modification cutting, slotting, scribing, marking, defect detection, and thickness measurement.
Backside metal annealing for SiC wafer device performance.
Modified cutting, stealth dicing, slotting, and scribing for semiconductor wafers.
Fully Automated Wafer Marking for identification and traceability.
Defect detection and thickness measurement for wafers, substrates, and epitaxial wafers.
Automation and smart factory support for semiconductor-related production.

Wafer laser annealing supports backside metal annealing for SiC wafers through coordinated wafer handling, laser annealing, and precision motion control.
Value Points
Supports SiC wafer backside metal annealing | Helps improve ohmic contact | Designed for fully automated wafer processing
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Fully Automated Wafer Laser Annealing Machine
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SiC wafer modification and cutting solutions use custom ultrafast lasers, high-precision motion platforms, dynamic focus compensation, and vision positioning for stealth dicing and die separation.
Value Points
Suitable for 6–8 inch wafers | Supports internal modification and die separation | Uses vision positioning and automated wafer handling
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Fully Automatic SiC Wafer Modification and Cutting Equipment
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SiC processing supports fully automatic wafer modification and cutting for 6–8 inch wafers, using ultrafast lasers, high-precision CCD vision, dynamic focus compensation, and automated wafer handling.
Value Points
Internal modification / stealth dicing | No front-side damage | Dynamic focus compensation | SEMI-standard automation | Supports advanced third-generation semiconductor manufacturing
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Fully Automatic SiC Wafer Modification and Cutting Equipment
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Wafer laser modified cutting supports internal modified cutting of silicon-based wafers for 8-inch and above chip packaging and testing applications.
Value Points
High-quality modified cutting | Small edge collapse and low surface damage | Supports high-efficiency wafer separation
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Wafer Laser Stealth Dicing Equipment
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Wafer slotting and laser scribing solutions support precision processing for low-k wafers, silicon-based GaN wafers, GPP wafers, and silicon or compound semiconductor wafers.
Value Points
Supports slotting and precision scribing | Suitable for semiconductor wafer processing | Covers nanosecond and picosecond scribing options
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Wafer Laser Slotting Equipment for Semiconductors
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Automatic wafer laser slotting equipment can support precision slotting and advanced wafer processing scenarios within semiconductor manufacturing.
Value Points
Wafer slotting | Precision laser processing | Semiconductor manufacturing support
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Wafer Laser Slotting Equipment for Semiconductors
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Wafer laser marking solutions support full-automatic marking for semiconductor wafers using wafer handling, coaxial vision positioning, and laser marking technology.
Value Points
Supports 2–6 inch wafer marking | Automatic positioning and edge finding | Supports identification and traceability
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Wafer Laser Marking Equipment for Semiconductors
Fully Automated Wafer Marking Equipment

Semiconductor wafer defect detection equipment supports inspection of patterned wafers and wafer surfaces for scratches, cracks, color differences, metal residue, and other defects.
Value Points
Suitable for 4–8 inch patterned wafers | Detects multiple surface defects | Supports high-resolution inspection
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Semiconductor Wafer Defect Detection Equipment
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Semiconductor substrate defect detection equipment supports defect inspection for wafers, substrates, epitaxial wafers, and patterned wafers.
Value Points
Applicable to multiple wafer and substrate types | Detects particles, pits, scratches, stains, and cracks | Supports upstream and midstream quality control
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Semiconductor Substrate Defect Detection Equipment
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Wafer thickness measuring equipment uses spectral confocal measurement to detect the size and flatness of semiconductor raw and epitaxial wafers.
Value Points
Supports raw and epitaxial wafer measurement | Focuses on size and flatness detection | Suitable for upstream semiconductor material production
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Semiconductor Wafer Thickness Measuring Equipment
Get a QuoteFARLEY·LASERLAB combines wafer annealing, wafer cutting, marking, defect detection, and thickness measurement to support semiconductor manufacturing.
Annealing, cutting, slotting, scribing, and marking
Defect detection and thickness measurement
Glass, quartz, optical glass, and ceramic substrate processing
FARLEY·LASERLAB supports semiconductor-related intelligent manufacturing through equipment, inspection, automation, and smart factory capabilities for laser processing and quality control.
Discuss semiconductor wafer and brittle-material processing solutions
Connect with our team to explore wafer processing, inspection, measurement, and hard-brittle material laser solutions.