MARVEL Series Laser Cutting Machine
SMART Series Laser Cutting Machine
WALC Series Laser Cutting Machine
GF Series Laser Cutting Machine
BF Series Bevel Laser Cutting Machine
Laser Blanking Production Line
FARLEY LASERLAB provides semiconductor and brittle-material solutions covering wafer annealing, laser modification cutting, slotting, scribing, marking, defect detection, thickness measurement, and precision glass or ceramic processing.
Backside metal annealing for SiC wafer device performance.
Modified cutting, stealth dicing, slotting, and scribing for semiconductor wafers.
Full-automatic wafer marking for identification and traceability.
Defect detection and thickness measurement for wafers, substrates, and epitaxial wafers.
Glass, quartz, optical glass, ceramic substrate, and other hard-brittle material cutting or drilling.
Automation and smart factory support for semiconductor-related production.

Wafer laser annealing supports backside metal annealing for SiC wafers through coordinated wafer handling, laser annealing, and precision motion control.

SiC wafer modification and cutting solutions use custom ultrafast lasers, high-precision motion platforms, dynamic focus compensation, and vision positioning for stealth dicing and die separation.

SiC processing supports fully automatic wafer modification and cutting for 6–8 inch wafers, using ultrafast lasers, high-precision CCD vision, dynamic focus compensation, and automated wafer handling.

Wafer laser modified cutting supports internal modified cutting of silicon-based wafers for 8-inch and above chip packaging and testing applications.

Wafer slotting and laser scribing solutions support precision processing for low-k wafers, silicon-based GaN wafers, GPP wafers, and silicon or compound semiconductor wafers.

Automatic wafer laser slotting equipment can support precision slotting and advanced wafer processing scenarios within semiconductor manufacturing.

Wafer laser marking solutions support full-automatic marking for semiconductor wafers using wafer handling, coaxial vision positioning, and laser marking technology.
Inspection and measurement modules help support wafer quality control, substrate defect detection, and raw or epitaxial wafer size and flatness measurement.

Semiconductor wafer defect detection equipment supports inspection of patterned wafers and wafer surfaces for scratches, cracks, color differences, metal residue, and other defects.
Value Points: Suitable for 4–8 inch patterned wafers | Detects multiple surface defects | Supports high-resolution inspection
Recommended Products: Wafer Defect Detection Series

Semiconductor substrate defect detection equipment supports defect inspection for wafers, substrates, epitaxial wafers, and patterned wafers.
Value Points: Applicable to multiple wafer and substrate types | Detects particles, pits, scratches, stains, and cracks | Supports upstream and midstream quality control
Recommended Products: Defect Detection Series | Semiconductor Substrate Defect Detection Equipment

Wafer thickness measuring equipment uses spectral confocal measurement to detect the size and flatness of semiconductor raw and epitaxial wafers.
Value Points: Supports raw and epitaxial wafer measurement | Focuses on size and flatness detection | Suitable for upstream semiconductor material production
Recommended Products: Wafer Thickness Measuring Series

Glass and quartz micro-perforation solutions support high-yield processing of hard-brittle materials using picosecond or short-pulse laser technology.
Suitable for glass and quartz
Supports micro-perforation
Designed for stable continuous processing

Glass and optical material laser cutting solutions support precise, non-contact processing for brittle materials such as cover glass, optical glass, and related components.
Non-contact cutting
Supports complex shapes
Suitable for glass and optical material processing

Ultrafast laser welding can support bonding of glass and transparent brittle materials without additional adhesives in selected precision manufacturing scenarios.
Transparent material welding
No additional adhesive
Low thermal impact

Ceramic substrate laser cutting solutions support high-efficiency and high-precision automatic processing for alumina, zirconium oxide, aluminum nitride, silicon nitride, and other ceramic materials.
Suitable for ceramic substrates
Supports automatic loading and unloading
High-speed and high-precision processing

FARLEY LASERLAB supports semiconductor-related intelligent manufacturing through equipment, inspection, automation, and smart factory capabilities for laser processing and quality control.
FARLEY LASERLAB combines wafer annealing, wafer cutting, marking, defect detection, thickness measurement, and brittle-material processing to support semiconductor and precision electronics manufacturing.
Support Cards: Wafer Processing — Annealing, cutting, slotting, scribing, and marking | Inspection & Measurement — Defect detection and thickness measurement | Brittle Material Processing — Glass, quartz, optical glass, and ceramic substrate processing
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