Precision laser and inspection solutions for semiconductor manufacturing

FARLEY·LASERLAB provides semiconductor solutions covering wafer annealing, laser modification cutting, slotting, scribing, marking, defect detection, and thickness measurement.

1

Wafer Annealing

Backside metal annealing for SiC wafer device performance.

2

Wafer Cutting & Dicing

Modified cutting, stealth dicing, slotting, and scribing for semiconductor wafers.

3

Wafer Marking & Traceability

Fully Automated Wafer Marking for identification and traceability.

4

Inspection & Measurement

Defect detection and thickness measurement for wafers, substrates, and epitaxial wafers.

5

Manufacturing Support

Automation and smart factory support for semiconductor-related production.

Core Equipment

Wafer Laser Annealing

Wafer laser annealing supports backside metal annealing for SiC wafers through coordinated wafer handling, laser annealing, and precision motion control.

Value Points

Supports SiC wafer backside metal annealing | Helps improve ohmic contact | Designed for fully automated wafer processing

Recommended Products

Fully Automated Wafer Laser Annealing Machine

Get a Quote

SiC Wafer Modification and Cutting

SiC wafer modification and cutting solutions use custom ultrafast lasers, high-precision motion platforms, dynamic focus compensation, and vision positioning for stealth dicing and die separation.

Value Points

Suitable for 6–8 inch wafers | Supports internal modification and die separation | Uses vision positioning and automated wafer handling

Recommended Products

Fully Automatic SiC Wafer Modification and Cutting Equipment

Get a Quote

Advanced SiC Processing

SiC processing supports fully automatic wafer modification and cutting for 6–8 inch wafers, using ultrafast lasers, high-precision CCD vision, dynamic focus compensation, and automated wafer handling.

Value Points

Internal modification / stealth dicing | No front-side damage | Dynamic focus compensation | SEMI-standard automation | Supports advanced third-generation semiconductor manufacturing

Recommended Products

Fully Automatic SiC Wafer Modification and Cutting Equipment

Get a Quote

Wafer Laser Modified Cutting

Wafer laser modified cutting supports internal modified cutting of silicon-based wafers for 8-inch and above chip packaging and testing applications.

Value Points

High-quality modified cutting | Small edge collapse and low surface damage | Supports high-efficiency wafer separation

Recommended Products

Wafer Laser Stealth Dicing Equipment

Get a Quote

Wafer Slotting and Scribing

Wafer slotting and laser scribing solutions support precision processing for low-k wafers, silicon-based GaN wafers, GPP wafers, and silicon or compound semiconductor wafers.

Value Points

Supports slotting and precision scribing | Suitable for semiconductor wafer processing | Covers nanosecond and picosecond scribing options

Recommended Products

Wafer Laser Slotting Equipment for Semiconductors

Get a Quote

Automatic Wafer Laser Slotting Intelligent Equipment

Automatic wafer laser slotting equipment can support precision slotting and advanced wafer processing scenarios within semiconductor manufacturing.

Value Points

Wafer slotting | Precision laser processing | Semiconductor manufacturing support

Recommended Products

Wafer Laser Slotting Equipment for Semiconductors

Get a Quote

Wafer Marking and Traceability

Wafer laser marking solutions support full-automatic marking for semiconductor wafers using wafer handling, coaxial vision positioning, and laser marking technology.

Value Points

Supports 2–6 inch wafer marking | Automatic positioning and edge finding | Supports identification and traceability

Recommended Products

Wafer Laser Marking Equipment for Semiconductors
Fully Automated Wafer Marking Equipment

Get a Quote

Wafer Defect Detection

Semiconductor wafer defect detection equipment supports inspection of patterned wafers and wafer surfaces for scratches, cracks, color differences, metal residue, and other defects.

Value Points

Suitable for 4–8 inch patterned wafers | Detects multiple surface defects | Supports high-resolution inspection

Recommended Products

Semiconductor Wafer Defect Detection Equipment

Get a Quote

Substrate Defect Detection

Semiconductor substrate defect detection equipment supports defect inspection for wafers, substrates, epitaxial wafers, and patterned wafers.

Value Points

Applicable to multiple wafer and substrate types | Detects particles, pits, scratches, stains, and cracks | Supports upstream and midstream quality control

Recommended Products

Semiconductor Substrate Defect Detection Equipment

Get a Quote

Wafer Thickness Measurement

Wafer thickness measuring equipment uses spectral confocal measurement to detect the size and flatness of semiconductor raw and epitaxial wafers.

Value Points

Supports raw and epitaxial wafer measurement | Focuses on size and flatness detection | Suitable for upstream semiconductor material production

Recommended Products

Semiconductor Wafer Thickness Measuring Equipment

Get a Quote
Why FARLEY·LASERLAB

Precision laser and inspection capabilities for semiconductor manufacturing

FARLEY·LASERLAB combines wafer annealing, wafer cutting, marking, defect detection, and thickness measurement to support semiconductor manufacturing.

Smart Manufacturing

Semiconductor Intelligent Manufacturing Support

FARLEY·LASERLAB supports semiconductor-related intelligent manufacturing through equipment, inspection, automation, and smart factory capabilities for laser processing and quality control.

  • Smart Factory
  • Inspection Integration
  • Data-connected Manufacturing Support
Get a Quote
Contact

Discuss semiconductor wafer and brittle-material processing solutions

Connect with our team to explore wafer processing, inspection, measurement, and hard-brittle material laser solutions.

Contact Sales View Semiconductor Products





    Please prove you are human by selecting the tree.